Structural characterization of WS? flakes by Photoluminescence and ultra-low frequency Raman spectroscopy on a unique multimode platform
2D materials are state-of-the-art in nano- and opto-electronics. Characterizing their structural properties with a non-destructive approach at the micron scale is very important. We demonstrate in this paper how LabRAM Soleil? confocal Raman multimode microscope is the perfect tool for these materials characterization.